test modes

? Single-Pulse Unclamped Inductive Switching (UIS)

? Single-Pulse Avalanche Stress (EAS)

? Repetitive Avalanche Energy (EAR)

? Repetitive Pulse to Failure (RPF)

features

? Single/Dual Device Testing

? N channel, P channel, Mixed

? All Solid State Switching – No Relays

? Timing Resolution of 40ns

? Current Range: 0.1A to 200A, 0.1A Steps

? Avalanche Voltage to 2500V

? Bipolar Gate Drive with 30V swing

? New High Efficiency Kelvin Circuit

? Touch-Screen Program Entry/Control

? Waveform Capture/Display

? Internal Test Program Storage (20 files)

? High Speed Inductor Charging, Reduces Test Time

? Programmable Leakage Test Voltage

? Pre/Post Avalanche Leakage Test

? Avalanche Collapse Test

? Versatile Test Handler Control

? Up to 15 Hardware Sort Bins

? Improved Voltage/Current Accuracy

? Software Updates via Flash Download

? Password Control of Parameter Entry

? Operates with all ITC Inductor Load Boxes

? Interfaces with ITC55MUX4 & ITC55-RSF

? Simple, Complete User Calibration

? Built-in Self Test